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Scientific Image - Atomic Force Microscope Illustration

Illustration of an Atomic Force Microscope (AFM) probe tip.

DESCRIPTION

Illustration of an Atomic Force Microscope (AFM) probe tip. AFMs are so sensitive that they can image individual atoms.

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DESCRIPTION

Illustration of an Atomic Force Microscope (AFM) probe tip. AFMs are so sensitive that they can image individual atoms.

JUMP TO BROWSE RELATED RESOURCES

Credits

YEAR CREATED
2016
OWNING INSTITUTION

Emily Maletz / NISE Network

FUNDING

Developed for the NISE Network with funding from the National Science Foundation under Award Numbers 0532536 and 0940143. Any opinions, findings, and conclusions or recommendations expressed in this product are those of the authors and do not necessarily reflect the views of the Foundation.

PERMISSIONS

Creative Commons Attribution Non-Commercial Share Alike 3.0 United States (CC BY-NC-SA 3.0 US).
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DEVELOPMENT PROCESS

NISE Network products are developed through an iterative collaborative process that includes scientific review, peer review, and visitor evaluation in accordance with an inclusive audiences approach. Products are designed to be easily edited and adapted for different audiences under a Creative Commons Attribution Non-Commercial Share Alike license. To learn more, visit our Development Process page.

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